Materials Imaging Mode

In materials imaging mode, a microwave source is capacitively coupled to the resonant transmission line, with the open-ended coaxial probe at the other end of the transmission line. The boundary conditions at the probe tip are perturbed by the region of the sample near the probe center-conductor, allowing high-resolution imaging of sample properties, such as sheet resistance and dielectric constant. This is accomplished by monitoring resonant frequency shifts and changes in quality factor (Q) of the microscope resonator.

1. Sheet Resistance 2. Imaging Linear and Nonlinear Dielectric Permitivity 3. Ferroelectric Polarization 4. Magnetic Permeability

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Center for Superconductivity Research, University of Maryland, College Park, MD 20742-4111
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